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"Ousted" Intel CEO Steps In To Defend The Firm's 18A Process, Says Yield Rate % Isn't The Right Metric To Measure Semiconductor Progress (wccftech.com)

submitted 1 week ago by floofloof@lemmy.ca to c/technology@lemmy.world

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[–] GorgeousWalrus@feddit.org 9 points 1 week ago

Yield over die area should be the metric.

If you have a chip that is 50% of the wafer area, a single fault will lead to a yield of 50%. Now compare it with a chip that is 1% of the wafer area, the same single fault gets a yield of 99%.

So comparing the yields of two processes without factoring in the die area is not a fair game.